Scanning electron microscopy (SEM)
A scanning electron microscope offers two advantages compared with a light microscope. One is the higher magnification and the second the natural depth of field.
Due to this photographs appear more spacial and plastic even without an overlay technique. The present picture highlights the mechanism that puts wave-cut technique ahead of the standard straight-cut. The sinusoidal edge contour gives more rigidity of the winding off-set and keeps the gap between the windings open. This is advantageous for the spraying process. The sprayed metal gains easier access and contact to the edges of the contact side. This finally results in a better pulse performance of the capacitor which is a plus in reliability and durability of the device.