Lab-Facilities
Testing of technical films, metallized/unmetallized, is mainly based on the parameters fixed in the DIN 406324 (today DIN EN 60674) and VDE 345.
The testing of capacitors is described in a variety of national (VDE, DIN VDE) and standardised European (DIN EN & IEC) norms. The most well-known standards are IEC 384 and VDE 560.
All evaluations in the Steiner laboratory are based on these testing procedures.
- Plainfilm (=unmetallized base film)
Plain film analysis
- Gloss
- Roughness
- Surface tension ( wetting test )
- Shrinkage
- Mechanical properties
- Electrical properties
- Metallized Film
Measurement on metallized film
- Resistance
- Geometry ( free margin, pattern, etc. )
- Shrinkage
- Roughness
• by weight measuring method
• by no. of turns and diameter
• by mechanical calibers
• by interferrometer measurement
- Mechanical properties
• Youngs modul (E-Modul)
• Tensile strength
- Analysis with light microscope
- Weak spots per square versus field stress
- Electrical breakdownstrength
- Climatic aging
- Testing of Capacitors
Non destructive measurements
- Capacity, Dissipation factor at 100, 1kHz 10kHz & 100kHz frequency
- Capacity, Dissipation versus AC-Voltage
- Insulation & recharging / leakage current versus temperature and voltage
- Electrical properties versus temperature; AC-endurance test
- Special Testing
Metallurgy
- Element analysis by X-ray-analysis
Image documentation
Cimatic testing e.g. 85°C/85% rel. humidity
Additionally to these testing methods we use standard equipment for the production of capacitors.
- Production of capacitors
- Winding on split mandrell or plastic cores
- Flattening with cold or heated plates
- Shooping
- Heat treatment of elements
• Heat treatment with constant temperature
• Dynamic heat treatment
- Pre-clearing
• DC – clearing by a charged capacitor
• DC – clearing with changing polarity
• AC - clearing
- Hand soldering of contact wires and encapsulation with PU-resin